NSN 5961-00-137-4257

Part Details | THYRISTOR SEMICONDUCTOR DEVICE

5961-00-137-4257 A bistable semiconductor device comprising three or more junctions which is normally a nonconductor until the application of a signal to a gate terminal, at which time the device switches to the conductive state. Includes devices capable of being switched back to the nonconductive state upon application of a different signal to the same or another gate terminal. May or may not include mounting hardware and/or heatsink. For solid state devices which are responsive to visible or infrared radiant energy, see SEMICONDUCTOR DEVICE, PHOTO.

Alternate Parts: C30EX7, C230EX7, 261787, 26-178-7, 261787, 26-178-7, 261787, 26-178-7, C230EX7, 5961-00-137-4257, 00-137-4257, 5961001374257, 001374257

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
59JUL 28, 197100-137-425733096 ( SEMICONDUCTOR DEVICE, THYRISTOR )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 5961-00-137-4257
Part Number Cage Code Manufacturer
C30EX709214GENERAL ELECTRIC COSEMI-CONDUCTOR PRODUCTS DEPT
C230EX709214GENERAL ELECTRIC COSEMI-CONDUCTOR PRODUCTS DEPT
26-178-73B150RAYTHEON COMPANYDBA RAYTHEON
26-178-754X10RAYTHEON COMPANYDBA RAYTHEON
26-178-749956RAYTHEON COMPANYDBA RAYTHEON
C230EX731338SEMITRONICS CORP
Technical Data | NSN 5961-00-137-4257
Characteristic Specifications
SEMICONDUCTOR MATERIAL SILICON
INTERNAL CONFIGURATION JUNCTION CONTACT
VOLTAGE RATING IN VOLTS PER CHARACTERISTIC500.0 MAXIMUM OFF-STATE VOLTAGE, DC
CURRENT RATING PER CHARACTERISTICDF25.00 MILLIAMPERES MAXIMUM
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT100.0 DEG CELSIUS JUNCTION
INCLOSURE MATERIAL METAL
MOUNTING METHOD THREADED STUD
MOUNTING FACILITY QUANTITY1
THREAD SERIES DESIGNATOR UNF
NOMINAL THREAD SIZE0.250 INCHES
TERMINAL TYPE AND QUANTITY1 THREADED STUD AND 2 TAB, SOLDER LUG
OVERALL LENGTH0.650 INCHES NOMINAL
OVERALL DIAMETER0.500 INCHES MAXIMUM
OVERALL WIDTH ACROSS FLATS0.562 INCHES NOMINAL
SPECIAL FEATURESJUNCTION PATTERN ARRANGEMENT: PNPN