NSN 6625-00-179-5844

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-00-179-5844 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: 902470, 902-470, ANUSM206A, 6625-00-179-5844, 00-179-5844, 6625001795844, 001795844

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66DEC 18, 196800-179-584425006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-179-5844
Part Number Cage Code Manufacturer
902-47028569HICKOK INCORPORATED
ANUSM206A80058JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM
Technical Data | NSN 6625-00-179-5844
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDTRANSISTOR BETA AND TRANSCONDUCTANCE MEASUREMENTS;DIODE AND TRANSISTOR ELECTRODE RESISTANCE;DIODE AND TRANSISTOR REVERSE LEAKAGE MEASUREMENTS;SHORTED OR OPEN DIODE TEST;BATTERY TESTS
OPERATING TEST CAPABILITYMETER;MICROMHOS;BETA;LEAKAGE TEST;BATTERY TEST
AC VOLTAGE RATINGA115.0 VOLTS
FREQUENCY RATINGB50.0 HERTZ AND C60.0 HERTZ
PHASE SINGLE
DC VOLTAGE RATINGB2.0 VOLTS AND C9.0 VOLTS
INTERNAL BATTERY ACCOMMODATION INCLUDED
INCLOSURE FEATURE SINGLE ITEM W/CARRYING CASE
MATERIAL AND LOCATION PLASTIC CARRYING CASE
HEIGHT10.000 INCHES NOMINAL
LENGTH9.000 INCHES NOMINAL
WIDTH8.000 INCHES NOMINAL
MAJOR COMPONENTSTEST SET,SEMICONDUCTOR DEVICE;COVER,TEST SET;LEAD,TEST;PROD,TEST
ACCESSORY COMPONENT QUANTITYA1$$A1$$A1$$A1
ACCESSORY CONTROLLING AGENCYJETDS AND JETDS AND JETDS AND JETDS
ACCESSORY IDENTIFYING NUMBERTS-2798 TO USM-206A TYPE NO. AND CW-1049 TO USM-206A TYPE NO. AND CX-11898 TO USM-206A TYPE NO. AND MX-6825A/USM-206A TYPE NO.
JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAMETEST,SEMICONDUCTOR DEVICE
JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBERTYPE NO. AN/USM-206A