NSN 6625-00-504-1949

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-00-504-1949 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: 39013, 390A3, 390A, 6625-00-504-1949, 00-504-1949, 6625005041949, 005041949

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66JAN 01, 196300-504-194925006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-504-1949
Part Number Cage Code Manufacturer
3901300752EDO LLCDIV ANTENNA PRODUCTS
390A300752EDO LLCDIV ANTENNA PRODUCTS
390A00752EDO LLCDIV ANTENNA PRODUCTS
Technical Data | NSN 6625-00-504-1949
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDTO MEASURE THE RELATIVE NOISE FIGURE OF MICROWAVE MIXER CRYSTALS,TO OBTAIN AN APPROXIMATE IMPEDANCE CHECK FOR SELECTING MATCHED CRYSTALS,FOR USE IN BALANCE MIXERS,TO MEASURE THE RELATIVE SENSITIVITY OF MICROWAVE DETECTOR CRYSTALS
OPERATING TEST CAPABILITYSILICON MIXER CRYSTALS,RANGE 0 TO 10000 MC,PORM 1/2 DB ON CONVERSION LOSS,PORM 0.5 DB ON NOISE TEMP
DC VOLTAGE RATINGA1.5 VOLTS
INTERNAL BATTERY ACCOMMODATION INCLUDED
INCLOSURE FEATURE SINGLE ITEM W/CARRYING CASE
MATERIAL AND LOCATION ALUMINUM CARRYING CASE
HEIGHT3.000 INCHES NOMINAL
LENGTH6.000 INCHES NOMINAL
WIDTH6.000 INCHES NOMINAL
SPECIAL FEATURESACCEPTS CERAMIC CARTRIDGE AND COAXIAL TYPES OF BOTH NORMAL AND REVERSED POLARITIES; REMOTE TEST JACK PERMITS TESTING CRYSTALS W/O REMOVING THEM FROM RECEIVER